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1

Architectural and Integration Options for 3D NAND Flash Memories

Micheloni, Rino, Crippa, Luca, Zambelli, Cristian, Olivo, Piero

Journal:

Year:

2017

Language:

english

File:

PDF, 5.58 MB

english, 2017

2

Impact of the NAND Flash Power Supply on Solid State Drives Reliability and Performance

Zambelli, Cristian, Micheloni, Rino, Crippa, Luca, Zuolo, Lorenzo, Olivo, Piero

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2018

Language:

english

File:

PDF, 640 KB

english, 2018

3

[IEEE 2017 IEEE International Memory Workshop (IMW) - Monterey, CA, USA (2017.5.14-2017.5.17)] 2017 IEEE International Memory Workshop (IMW) - Characterization of TLC 3D-NAND Flash Endurance through Machine Learning for LDPC Code Rate Optimization

Zambelli, Cristian, Cancelliere, Giuseppe, Riguzzi, Fabrizio, Lamma, Evelina, Olivo, Piero, Marelli, Alessia, Micheloni, Rino

Year:

2017

Language:

english

File:

PDF, 402 KB

english, 2017

4

Reliability of erasing operation in NOR-Flash memories

Andrea Chimenton, Piero Olivo

Journal:

Microelectronics Reliability

Year:

2005

Language:

english

File:

PDF, 1.04 MB

english, 2005

5

Impact of temperature on conduction mechanisms and switching parameters in HfO 2 -based 1T-1R resistive random access memories devices

Pérez, Eduardo, Wenger, Christian, Grossi, Alessandro, Zambelli, Cristian, Olivo, Piero, Roelofs, Robin

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Year:

2017

Language:

english

File:

PDF, 1.41 MB

english, 2017

6

Modeling the Endurance Reliability of Intradisk RAID Solutions for Mid-1X TLC NAND Flash Solid-State Drives

Zambelli, Cristian, Marelli, Alessia, Micheloni, Rino, Olivo, Piero

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2017

Language:

english

File:

PDF, 1.84 MB

english, 2017

7

[IEEE 2007 Ph.D Research in Microelectronics and Electronics Conference - (2007.07.2-2007.07.5)] 2007 Ph.D Research in Microelectronics and Electronics Conference - Statistical methodologies for integrated circuits design

Padovani, Andrea, Chimenton, Andrea, Olivo, Piero, Fantini, Paolo, Vendrame, Loris, Mennillo, Serena

Year:

2007

Language:

english

File:

PDF, 166 KB

english, 2007

8

Solid-State Drives: Memory Driven Design Methodologies for Optimal Performance

Zuolo, Lorenzo, Zambelli, Cristian, Micheloni, Rino, Olivo, Piero

Journal:

Proceedings of the IEEE

Year:

2017

Language:

english

File:

PDF, 3.31 MB

english, 2017

9

[IEEE 2016 IEEE International Reliability Physics Symposium (IRPS) - Pasadena, CA, USA (2016.4.17-2016.4.21)] 2016 IEEE International Reliability Physics Symposium (IRPS) - Power-supply impact on the reliability of mid-1X TLC NAND flash memories

Zambelli, Cristian, King, Pietro, Olivo, Piero, Crippa, Luca, Micheloni, Rino

Year:

2016

Language:

english

File:

PDF, 506 KB

english, 2016

10

First Evidence of Temporary Read Errors in TLC 3D-NAND Flash Memories Exiting From an Idle State

Zambelli, Cristian, Micheloni, Rino, Scommegna, Salvatrice, Olivo, Piero

Journal:

IEEE Journal of the Electron Devices Society

Year:

2020

File:

PDF, 2.73 MB

2020

11

Implications of the Incremental Pulse and Verify Algorithm on the Forming and Switching Distributions in RERAM Arrays

Crupi, Felice, Filice, Francesco, Grossi, Alessandro, Zambelli, Cristian, Olivo, Piero, Perez, Eduardo, Wenger, Christian

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2016

Language:

english

File:

PDF, 1.44 MB

english, 2016

12

LDPC Soft Decoding with Improved Performance in 1X-2X MLC and TLC NAND Flash-Based Solid State Drives

Zuolo, Lorenzo, Zambelli, Cristian, Marelli, Alessia, Micheloni, Rino, Olivo, Piero

Journal:

IEEE Transactions on Emerging Topics in Computing

Year:

2017

Language:

english

File:

PDF, 1.13 MB

english, 2017

13

Electrical characterization and modeling of pulse-based forming techniques in RRAM arrays

Grossi, Alessandro, Zambelli, Cristian, Olivo, Piero, Miranda, Enrique, Stikanov, Valeriy, Walczyk, Christian, Wenger, Christian

Journal:

Solid-State Electronics

Year:

2016

Language:

english

File:

PDF, 1.48 MB

english, 2016

14

Exposing Reliability/Performance Tradeoff in Non-Volatile Memories Through Erratic Bits Signature Classification

Zambelli, Cristian, Koebernik, Gert, Ullmann, Rudolf, Bauer, Matthias, Tempel, Georg, Di Tano, Fabrizio, Atti, Massimo, Pistone, Francesco Paolo, Siviero, Andrea, Olivo, Piero

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2014

Language:

english

File:

PDF, 1.80 MB

english, 2014

15

[IEEE 2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - Napoli, Italy (2015.4.21-2015.4.23)] 2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - Automated characterization of TAS-MRAM test arrays

Grossi, Alessandro, Zambelli, Cristian, Olivo, Piero, Pellati, Paolo, Ramponi, Michele, Alvarez-Herault, Jeremy, Mackay, Ken

Year:

2015

Language:

english

File:

PDF, 497 KB

english, 2015

16

[IEEE 2015 15th Non-Volatile Memory Technology Symposium (NVMTS) - Beijing, China (2015.10.12-2015.10.14)] 2015 15th Non-Volatile Memory Technology Symposium (NVMTS) - Reliability and cell-to-cell variability of TAS-MRAM arrays under cycling conditions

Grossi, Alessandro, Zambelli, Cristian, Olivo, Piero, Alvarez-Herault, Jeremy, Mackay, Ken

Year:

2015

Language:

english

File:

PDF, 393 KB

english, 2015

17

Characterization of the Over-Erase Algorithm in FN/FN Embedded nor Flash Arrays

Zambelli, Cristian, Olivo, Piero

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2015

Language:

english

File:

PDF, 709 KB

english, 2015

18

[IEEE 2018 International Integrated Reliability Workshop (IIRW) - South Lake Tahoe, CA, USA (2018.10.7-2018.10.11)] 2018 International Integrated Reliability Workshop (IIRW) - Cross-Temperature Effects of Program and Read Operations in 2D and 3D NAND Flash Memories

Zambelli, Cristian, Crippa, Luca, Micheloni, Rino, Olivo, Piero

Year:

2018

Language:

english

File:

PDF, 319 KB

english, 2018

19

Solid-State Drives (SSDs) [Scanning the Issue]

Micheloni, Rino, Olivo, Piero

Journal:

Proceedings of the IEEE

Year:

2017

Language:

english

File:

PDF, 218 KB

english, 2017

20

Quality-of-Service Implications of Enhanced Program Algorithms for Charge-Trapping NAND in Future Solid-State Drives

Grossi, Alessandro, Zuolo, Lorenzo, Restuccia, Francesco, Zambelli, Cristian, Olivo, Piero

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2015

Language:

english

File:

PDF, 1.62 MB

english, 2015

21

A Bist Scheme for Non-Volatile Memories

Piero Olivo, Marcello Dalpasso

Journal:

Journal of Electronic Testing

Year:

1998

Language:

english

File:

PDF, 1.16 MB

english, 1998

22

[IEEE 2014 International Conference on Microelectronic Test Structures (ICMTS) - Udine, Italy (2014.3.24-2014.3.27)] 2014 International Conference on Microelectronic Test Structures (ICMTS) - Statistical analysis of resistive switching characteristics in ReRAM test arrays

Zambelli, Cristian, Grossi, Alessandro, Olivo, Piero, Walczyk, Damian, Bertaud, Thomas, Tillack, Bernd, Schroeder, Thomas, Stikanov, Valeriy, Walczyk, Christian

Year:

2014

Language:

english

File:

PDF, 1.31 MB

english, 2014

23

FLARES

Carlo, Stefano Di, Galfano, Salvatore, Indaco, Marco, Prinetto, Paolo, Bertozzi, Davide, Olivo, Piero, Zambelli, Cristian

Journal:

ACM Transactions on Architecture and Code Optimization

Year:

2014

Language:

english

File:

PDF, 1.09 MB

english, 2014

24

[IEEE 2015 IEEE International Memory Workshop (IMW) - Monterey, CA, USA (2015.5.17-2015.5.20)] 2015 IEEE International Memory Workshop (IMW) - LDPC Soft Decoding with Reduced Power and Latency in 1X-2X NAND Flash-Based Solid State Drives

Zuolo, Lorenzo, Zambelli, Cristian, Olivo, Piero, Micheloni, Rino, Marelli, Alessia

Year:

2015

Language:

english

File:

PDF, 546 KB

english, 2015

25

[IEEE 2011 3rd IEEE International Memory Workshop (IMW) - Monterey, CA, USA (2011.05.22-2011.05.25)] 2011 3rd IEEE International Memory Workshop (IMW) - Characterization of a MEMS-Based Embedded Non Volatile Memory Array for Extreme Environments

Zambelli, Cristian, Olivo, Piero, Gaddi, Roberto, Schepens, Cor, Smith, Charles

Year:

2011

Language:

english

File:

PDF, 590 KB

english, 2011

26

Mechanism of the Key Impact of Residual Carbon Content on the Reliability of Integrated Resistive Random Access Memory Arrays

Niu, Gang, Cartoixà, Xavier, Grossi, Alessandro, Zambelli, Cristian, Olivo, Piero, Perez, Eduardo, Schubert, Markus Andreas, Zaumseil, Peter, Costina, Ioan, Schroeder, Thomas, Wenger, Christian

Journal:

The Journal of Physical Chemistry C

Year:

2017

Language:

english

File:

PDF, 7.39 MB

english, 2017

27

Electrical characterization and modeling of 1T-1R RRAM arrays with amorphous and poly-crystalline HfO2

Grossi, Alessandro, Zambelli, Cristian, Olivo, Piero, Crespo-Yepes, Alberto, Martin-Martinez, Javier, Rodríguez, Rosana, Nafria, Monserrat, Perez, Eduardo, Wenger, Christian

Journal:

Solid-State Electronics

Year:

2016

Language:

english

File:

PDF, 1.21 MB

english, 2016

28

Cell-to-Cell Fundamental Variability Limits Investigation in OxRRAM Arrays

Grossi, Alessandro, Zambelli, Cristian, Olivo, Piero, Nowak, Etienne, Molas, Gabriel, Nodin, Jean Francois, Perniola, Luca

Journal:

IEEE Electron Device Letters

Year:

2018

Language:

english

File:

PDF, 823 KB

english, 2018

29

[ECS 2007 International Conference on Semiconductor Technology for Ultra Large Scale Integrated Circuits and Thin Film Transistors (ULSIC vs. TFT) - Barga, Italy (July 28 - August 3, 2007)] ECS Transactions - Dielectric Reliability for Future Logic and Non-Volatile Memory Applications: a Statistical Simulation Analysis Approach

Padovani, Andrea, Larcher, Luca, Chimenton, Andrea, Pavan, Paolo, Olivo, Piero

Year:

2007

Language:

english

File:

PDF, 452 KB

english, 2007

30

[IEEE 2015 International Conference on Memristive Systems (MEMRISYS) - Paphos, Cyprus (2015.11.8-2015.11.10)] 2015 International Conference on Memristive Systems (MEMRISYS) - Radiation hard design of HfO2 based 1T1R cells and memory arrays

Grossi, Alessandro, Calligaro, Cristiano, Perez, Eduardo, Schmidt, Jens, Teply, Florian, Mausolf, Thomas, Zambelli, Cristian, Olivo, Piero, Wenger, Christian

Year:

2015

Language:

english

File:

PDF, 278 KB

english, 2015

31

Characterization of the Interface-Driven 1st Reset Operation in HfO2-based 1T1R RRAM Devices

Pérez, Eduardo, Mahadevaiah, Mamathamba Kalishettyhalli, Zambelli, Cristian, Olivo, Piero, Wenger, Christian

Journal:

Solid-State Electronics

Year:

2019

Language:

english

File:

PDF, 4.23 MB

english, 2019

32

[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - Analysis of reliability/performance trade-off in Solid State Drives

Zuolo, Lorenzo, Zambelli, Cristian, Micheloni, Rino, Bertozzi, Davide, Olivo, Piero

Year:

2014

Language:

english

File:

PDF, 599 KB

english, 2014

33

[IEEE 2011 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2011.04.10-2011.04.14)] 2011 International Reliability Physics Symposium - Reliability and performance characterization of a mems-based non-volatile switch

Gaddi, Roberto, Schepens, Cor, Smith, Charles, Zambelli, Cristian, Chimenton, Andrea, Olivo, Piero

Year:

2011

Language:

english

File:

PDF, 761 KB

english, 2011

34

Data retention investigation in Al:HfO 2 -based resistive random access memory arrays by using high-temperature accelerated tests

Perez, Eduardo, Mahadevaiah, Mamathamba K., Zambelli, Cristian, Olivo, Piero, Wenger, Christian

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Year:

2019

Language:

english

File:

PDF, 1.15 MB

english, 2019

35

Enabling Computational Storage through FPGA Neural Network Accelerator for Enterprise SSD

Zambelli, Cristian, Bertaggia, Riccardo, Zuolo, Lorenzo, Micheloni, Rino, Olivo, Piero

Journal:

IEEE Transactions on Circuits and Systems II: Express Briefs

Year:

2019

Language:

english

File:

PDF, 4.40 MB

english, 2019

36

Characterization of flash structures erased with ultra-short pulses

Massimo Lanzoni, Carlo Riva, Piero Olivo

Journal:

Microelectronics Journal

Year:

1994

Language:

english

File:

PDF, 260 KB

english, 1994

37

Impact of the Incremental Programming Algorithm on the Filament Conduction in HfO 2 -Based RRAM Arrays

Perez, Eduardo, Grossi, Alessandro, Zambelli, Cristian, Olivo, Piero, Wenger, Christian

Journal:

IEEE Journal of the Electron Devices Society

Year:

2017

Language:

english

File:

PDF, 898 KB

english, 2017

38

Toward Reliable Multi-Level Operation in RRAM Arrays: Improving Post-Algorithm Stability and Assessing Endurance/Data Retention

Perez, Eduardo, Zambelli, Cristian, Mahadevaiah, Mamathamba Kalishettyhalli, Olivo, Piero, Wenger, Christian

Journal:

IEEE Journal of the Electron Devices Society

Year:

2019

Language:

english

File:

PDF, 3.72 MB

english, 2019

39

[IEEE 2009 Proceedings of the European Solid State Device Research Conference (ESSDERC) - Athens, Greece (2009.09.14-2009.09.18)] 2009 Proceedings of the European Solid State Device Research Conference - Analysis and optimization of erasing waveform in phase change memory arrays

Zambelli, Cristian, Chimenton, Andrea, Olivo, Piero

Year:

2009

Language:

english

File:

PDF, 1.03 MB

english, 2009

40

[IEEE 2010 IEEE International Memory Workshop - Seoul, Korea (South) (2010.05.16-2010.05.19)] 2010 IEEE International Memory Workshop - Experimental characterization of SET seasoning on Phase Change Memory arrays

Zambelli, Cristian, Chimenton, Andrea, Olivo, Piero

Year:

2010

Language:

english

File:

PDF, 437 KB

english, 2010

41

[IEEE 2014 IEEE 6th International Memory Workshop (IMW) - Taipei, Taiwan (2014.5.18-2014.5.21)] 2014 IEEE 6th International Memory Workshop (IMW) - Electrical characterization of read window in reram arrays under different SET/RESET cycling conditions

Zambelli, Cristian, Grossi, Alessandro, Olivo, Piero, Walczyk, Damian, Dabrowski, Jarek, Tillack, Bernd, Schroeder, Thomas, Kraemer, Rolf, Stikanov, Valeriy, Walczyk, Christian

Year:

2014

Language:

english

File:

PDF, 755 KB

english, 2014

42

Compact Modeling of Negative Vₜ Shift Disturb in NAND Flash Memories

Zambelli, Cristian, Andrian, Fabio, Aritome, Seiichi, Olivo, Piero

Journal:

IEEE Transactions on Electron Devices

Year:

2016

Language:

english

File:

PDF, 1.78 MB

english, 2016

43

[IEEE 2017 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2017.4.2-2017.4.6)] 2017 IEEE International Reliability Physics Symposium (IRPS) - Uniform and concentrated read disturb effects in mid-1X TLC NAND flash memories for enterprise solid state drives

Zambelli, Cristian, Olivo, Piero, Crippa, Luca, Marelli, Alessia, Micheloni, Rino

Year:

2017

Language:

english

File:

PDF, 647 KB

english, 2017

44

Erratic Bits in Flash Memories under Fowler-Nordheim Programming

Chimenton, Andrea, Pellati, Paolo, Olivo, Piero

Journal:

Japanese Journal of Applied Physics

Year:

2003

Language:

english

File:

PDF, 653 KB

english, 2003

45

[IEEE 2015 IEEE International Memory Workshop (IMW) - Monterey, CA, USA (2015.5.17-2015.5.20)] 2015 IEEE International Memory Workshop (IMW) - Relationship among Current Fluctuations during Forming, Cell-To-Cell Variability and Reliability in RRAM Arrays

Grossi, Alessandro, Zambelli, Cristian, Olivo, Piero, Miranda, Enrique, Stikanov, Valeriy, Schroeder, Thomas, Walczyk, Christian, Wenger, Christian

Year:

2015

Language:

english

File:

PDF, 291 KB

english, 2015

46

Is Consumer Electronics Redesigning Our Cars?: Challenges of Integrated Technologies for Sensing, Computing, and Storage

Pieri, Francesco, Zambelli, Cristian, Nannini, Andrea, Olivo, Piero, Saponara, Sergio

Journal:

IEEE Consumer Electronics Magazine

Year:

2018

Language:

english

File:

PDF, 2.17 MB

english, 2018

47

Testing of E2PROM aging and endurance: A case study

Massimo Lanzoni, Roberto Menozzi, Piero Olivo, Bruno Riccò, Andrea Haardt

Journal:

Transactions on Emerging Telecommunications Technologies

Year:

1990

Language:

english

File:

PDF, 641 KB

english, 1990

48

SSDExplorer: A Virtual Platform for Performance/Reliability-Oriented Fine-Grained Design Space Exploration of Solid State Drives

Zuolo, Lorenzo, Zambelli, Cristian, Micheloni, Rino, Indaco, Marco, Carlo, Stefano Di, Prinetto, Paolo, Bertozzi, Davide, Olivo, Piero

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2015

Language:

english

File:

PDF, 1.70 MB

english, 2015

49

An uncommon urticaria

Bertolo, Olivo, Risucci, Piero, Pollet, Cristina, Sechi, Antonio

Journal:

Emergency Care Journal

Year:

2007

File:

PDF, 1.18 MB

2007

50

Reliability of Logic-in-Memory Circuits in Resistive Memory Arrays

Zanotti, Tommaso, Zambelli, Cristian, Puglisi, Francesco Maria, Milo, Valerio, Perez, Eduardo, Mahadevaiah, Mamathamba K., Ossorio, Oscar G., Wenger, Christian, Pavan, Paolo, Olivo, Piero, Ielmini, Da

Journal:

IEEE Transactions on Electron Devices

Year:

2020

File:

PDF, 1.44 MB

2020

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